SLD constant-stress ADT data analysis based on time series method

Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered ade...

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Bibliographic Details
Published in2009 8th International Conference on Reliability, Maintainability and Safety pp. 1313 - 1317
Main Authors Li Wang, Xiaoyang Li, Tongmin Jiang, Bo Wan
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2009
Subjects
Constant stress accelerated degradation testing (CSADT)
Data analysis
Degradation
Life estimation
Performance analysis
Predictive models
Stress
Super Luminescent Diode (SLD)
Superluminescent diodes
Testing
Time series analysis
Yttrium
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Summary:Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered adequately. This paper proposes a CSADT data analysis method based on time series method. It proposes a time series modeling procedure to model product performance degradation data. An example of SLD CASDT is given as an application of the modeling technique and the estimation method is presented.
ISBN:1424449030
9781424449033
DOI:10.1109/ICRMS.2009.5270019