A Hall sensor microsystem with integrated voltage and current references for continuous sensitivity calibration

This paper presents a Hall sensor microsystem with a current output and sensitivity calibration targeting low drift (<;50ppm/°C). The main system novelty is in a circuit-level solution using dedicated on-chip voltage and current references for a continuous measurement and calibration of the sensi...

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Bibliographic Details
Published in2012 IEEE International Conference on Circuits and Systems (ICCAS) pp. 190 - 193
Main Authors Ajbl, A., Pastre, M., Kayal, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2012
Subjects
Calibration
Continuous Sensitivity Calibration
Current measurement
Current-Mode Output
Hall Sensor Microsystem
Sensitivity
Temperature measurement
Temperature sensors
Thermal stability
Voltage measurement
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Summary:This paper presents a Hall sensor microsystem with a current output and sensitivity calibration targeting low drift (<;50ppm/°C). The main system novelty is in a circuit-level solution using dedicated on-chip voltage and current references for a continuous measurement and calibration of the sensitivity. The system is fabricated in a 0.35μm CMOS technology, occupying an area of 11.55mm 2 . The measurements of the calibrated system show 80ppm/°C on average and 30ppm/°C best-case sensitivity drift over a temperature range from -40°C to 85°C. Compared to the state of the art, the fully integrated system for sensitivity calibration adds no more than 18ppm/°C on average and 30ppm/°C in the worst case for the additional integration of one voltage and one current reference.
ISBN:9781467331173
1467331171
DOI:10.1109/ICCircuitsAndSystems.2012.6408328