Assessment of ageing through periodic exposure to damp heat (85°c / 85 % RH) of seven different thin-film module types
In this paper we have investigated the accelerated ageing of seven different thin-film module types through the use of sequential damp heat (85°C/85% RH) tests. The module types [a-Si, tandem a-Si/a-Si micro-morph a-Si/¿-Si, triple junction a-Si, CIS (x2) and CdTe] were selected to cover a range of...
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Published in | 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) pp. 002220 - 002225 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.06.2009
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Subjects | |
Online Access | Get full text |
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Summary: | In this paper we have investigated the accelerated ageing of seven different thin-film module types through the use of sequential damp heat (85°C/85% RH) tests. The module types [a-Si, tandem a-Si/a-Si micro-morph a-Si/¿-Si, triple junction a-Si, CIS (x2) and CdTe] were selected to cover a range of thin-film devices, materials and construction types. Sequential damp heat tests for cumulative exposure times of 250, 1000, 2000 and 3000 h have been achieved to date, with the modules subjected to visual inspection, electrical insulation measurements and electrical performance measurements (IV curves). A wide range of performance losses (P max ), from almost zero to -70%, were evident for the different technologies. Sequential damp heat exposure tests can be used to induce accelerated aging on thin-film modules. However, it is not possible to equate loss of power to a number of years of outdoor exposure due to the lack of knowledge of the acceleration factors for each PV module type. |
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ISBN: | 1424429498 9781424429493 |
ISSN: | 0160-8371 |
DOI: | 10.1109/PVSC.2009.5411378 |