Pulsed-field EMI susceptibility analysis of microelectronic circuits - A full time-domain methodology

A full time-domain methodology is developed for analyzing the susceptibility of microwave electronic circuits to pulsed-field electromagnetic (EM) disturbances. The method is based on the consideration that micro-electronic circuits in their EM radiation behavior can be conceived as to consist of op...

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Bibliographic Details
Published in2012 42nd European Microwave Conference pp. 337 - 339
Main Authors De Hoop, A. T., Blok, H., Lager, I. E., Stumpf, M., Vandenbosch, G. A. E.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2012
Subjects
Integrated circuit modeling
Magnetic susceptibility
Tensile stress
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Summary:A full time-domain methodology is developed for analyzing the susceptibility of microwave electronic circuits to pulsed-field electromagnetic (EM) disturbances. The method is based on the consideration that micro-electronic circuits in their EM radiation behavior can be conceived as to consist of open (parallel-plate) resonators that are mutually coupled through their connecting feeds and are susceptible to disturbing incident fields through their apertures. In this respect, they are similar in behavior to the well-known ultra wideband patch antennas. The key issue to the method is to characterize each of these resonators by its natural modes of oscillation. Theoretically, these natural oscillations are adequately modelled through the time Laplace transform domain counterparts of the electromagnetic reciprocity theorem of the time-convolution type.
ISBN:1467322156
9781467322157
DOI:10.23919/EuMC.2012.6459110