Aberration measurement of fast pulse generators using sampling oscilloscopes

The definition, measurement, and traceability of aberrations in pulse waveform metrology is discussed. The use of reference waveforms and masks allows the definition of aberrations within specific regions relative to the transition point of a pulse generator, as desired by manufacturers and users. O...

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Bibliographic Details
Published in56th ARFTG Conference Digest Vol. 38; pp. 1 - 5
Main Authors Smith, Andrew J A, Roddie, Alan G, Woolliams, Peter D, Harper, Matthew R
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.11.2000
Subjects
Bandwidth
Calibration
Filters
Laboratories
Manufacturing
Oscilloscopes
Pulse generation
Pulse measurements
Sampling methods
Time measurement
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Summary:The definition, measurement, and traceability of aberrations in pulse waveform metrology is discussed. The use of reference waveforms and masks allows the definition of aberrations within specific regions relative to the transition point of a pulse generator, as desired by manufacturers and users. Of particular importance is the definition of aberrations for specific bandwidths, often required by the end user. An attempt has been made to identify anomalous structure and its source, whether in the oscilloscope or pulse generator. By using the information obtained it is now possible to correct a pulse generator waveform to a much more realistic shape and with a better correspondence to dc amplitude calibration values.
DOI:10.1109/ARFTG.2000.327444