Nanorobotic manipulation setup for pick-and-place handling and nondestructive characterization of carbon nanotubes

A nanorobotic manipulation setup for the handling and characterization of carbon nanotubes (CNTs) is presented. The nanorobotic setup can be integrated into a scanning electron microscope (SEM) and various endeffectors may be attached to the manipulator either for CNT handling or characterization. T...

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Bibliographic Details
Published in2007 IEEE/RSJ International Conference on Intelligent Robots and Systems pp. 291 - 296
Main Authors Eichhorn, V., Carlson, K., Andersen, K.N., Fatikow, S., Boggild, P.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2007
Subjects
Assembly
Atomic force microscopy
Atomic measurements
Carbon nanotubes
Electrothermal effects
Force measurement
Grippers
Piezoresistance
Probes
Scanning electron microscopy
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ISBN9781424409112
142440911X
ISSN2153-0858
DOI10.1109/IROS.2007.4398979

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Summary:A nanorobotic manipulation setup for the handling and characterization of carbon nanotubes (CNTs) is presented. The nanorobotic setup can be integrated into a scanning electron microscope (SEM) and various endeffectors may be attached to the manipulator either for CNT handling or characterization. The pick-and-place task is carried out by using an electrothermal actuated microgripper, designed for controlled manipulation of nanotubes. The nanotube is picked up from an array of multiwalled carbon nanotubes (MWCNTs) and transferred to the tip of an atomic force microscope (AFM) probe in order to assemble a high-aspect ratio AFM supertip. Another application of the nanorobotic setup considered in this paper is the nondestructive mechanical characterization of CNTs. A piezoresistive AFM probe is used to bend MWCNTs, while the bending force is measured, in order to estimate the Young's modulus of the investigated MWCNTs.
ISBN:9781424409112
142440911X
ISSN:2153-0858
DOI:10.1109/IROS.2007.4398979