Giant nonlinear optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films on quartz substrate

The nonlinear properties of Bi 3.25 La 0.75 Ti 3 O 12 thin film grown on quartz substrate is measured using the Z-scan technique with ps-laser pulses at 532-nm wavelength. The nonlinear refractive index and absorption coefficients are 0.31times10 cm 2 /W and 3times10 -5 cm/W, respectively, indicatin...

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Published in2007 Conference on Lasers and Electro-Optics - Pacific Rim pp. 1 - 2
Main Authors Heedeuk Shin, Hye Jeong Chang, Boyd, R.W., Choi, M.R., Jo, W.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2007
Subjects
Bismuth
Ferroelectric materials
Nonlinear optics
Optical films
Optical refraction
Optical variables control
Pulse measurements
Substrates
Transistors
Wavelength measurement
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Summary:The nonlinear properties of Bi 3.25 La 0.75 Ti 3 O 12 thin film grown on quartz substrate is measured using the Z-scan technique with ps-laser pulses at 532-nm wavelength. The nonlinear refractive index and absorption coefficients are 0.31times10 cm 2 /W and 3times10 -5 cm/W, respectively, indicating Bi 3.25 La 0.75 Ti 3 O 12 film on quartz is a good candidate for applications in nonlinear optical devices.
ISBN:1424411734
9781424411733
DOI:10.1109/CLEOPR.2007.4391334