APA (7th ed.) Citation

Lall, P., Hande, M., Bhat, C., Islam, N., Suhling, J., & Lee, J. (2006). Feature extraction and damage-precursors for prognostication of lead-free electronics. 56th Electronic Components and Technology Conference 2006, 10 pp.. https://doi.org/10.1109/ECTC.2006.1645736

Chicago Style (17th ed.) Citation

Lall, Pradeep, Madhura Hande, Chandan Bhat, Nokibul Islam, J. Suhling, and J. Lee. "Feature Extraction and Damage-precursors for Prognostication of Lead-free Electronics." 56th Electronic Components and Technology Conference 2006 2006: 10 pp.. https://doi.org/10.1109/ECTC.2006.1645736.

MLA (9th ed.) Citation

Lall, Pradeep, et al. "Feature Extraction and Damage-precursors for Prognostication of Lead-free Electronics." 56th Electronic Components and Technology Conference 2006, 2006, p. 10 pp., https://doi.org/10.1109/ECTC.2006.1645736.