Multiscale Orientation and Recognition for Permanent Scatterers

How to effectively detect and identify permanent scatterers (PS) from SAR images is one of the crucial procedures in PS interferometric system. In this paper, a new method of PS detection is presented by using the wavelet multi-scale product and wavelet modulus maxima according to the PS targets...

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Bibliographic Details
Published in2009 2nd International Congress on Image and Signal Processing pp. 1 - 5
Main Authors Guan, Zequn, Bai, Junwu
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2009
Subjects
Phase measurement
Radar detection
Radar scattering
Satellites
Speckle
Synthetic aperture radar
Synthetic aperture radar interferometry
Testing
Vegetation mapping
Wavelet analysis
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Summary:How to effectively detect and identify permanent scatterers (PS) from SAR images is one of the crucial procedures in PS interferometric system. In this paper, a new method of PS detection is presented by using the wavelet multi-scale product and wavelet modulus maxima according to the PS targets' features and the characteristics of speckle noise in SAR image. This paper analyzed the theory of wavelet multi-scale product and wavelet modulus maxima and its suitability for identifying PS points respectively. Using 4 SAR images over Nanjin from satellites ENVISAT of European Space Agency, both of the methods have been validated for PS detection. The testing results show that both the two algorithm can identify PS from SAR images effectively and reliably. Of which the method using wavelet modulus maxima has stronger anti-noise ability.
ISBN:1424441293
9781424441297
DOI:10.1109/CISP.2009.5300899