Scaleable equivalent circuit modelling of the E-field coupling to microstrips in the TEM cell

This investigation focuses on setting up a discrete model of the coupling between a TEM field generated inside a TEM cell to a device under test for use in a circuit simulator. In first instance, different microstrips are used as device under test because of their well-defined characteristics. The r...

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Bibliographic Details
Published in2008 International Symposium on Electromagnetic Compatibility - EMC Europe pp. 1 - 6
Main Authors Vanhee, F., Catrysse, J., Gillon, R., Gielen, G.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2008
Subjects
Capacitance
Circuit simulation
Circuit testing
coupling capacitance
Coupling circuits
Equivalent circuits
Frequency
IEC standards
Immunity testing
Microstrip
microstrips
modelling
TEM cell
TEM cells
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Summary:This investigation focuses on setting up a discrete model of the coupling between a TEM field generated inside a TEM cell to a device under test for use in a circuit simulator. In first instance, different microstrips are used as device under test because of their well-defined characteristics. The resulting models of the TEM cell, the microstrips and the electric field coupling between them are explained. Comparison and validation by measurements is presented for all models.
ISSN:2325-0356
DOI:10.1109/EMCEUROPE.2008.4786908