A 7.7mW/1.0ns/1.35V delay locked loop with racing mode and OA-DCC for DRAM interface

• Published in: 2010 IEEE International Symposium on Circuits and Systems (ISCAS) pp. 3861 - 3864
• Main Authors: Hyun-Woo Lee, Yong-Hoon Kim, Won-Joo Yun, Eun Young Park, Kang Youl Lee, Jaeil Kim, Kwang Hyun Kim, Jong Ho Jung, Kyung Whan Kim, Nam Gyu Rye, Kwan-Weon Kim, Jun Hyun Chun, Chulwoo Kim, Young-Jung Choi, Byong-Tae Chung, Joong Sik Kih
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.05.2010
• Subjects: Delay lines; Detectors; Energy consumption; Frequency; Jitter; Logic gates; Power engineering and energy; Random access memory; SDRAM; Shift registers
• ISBN: 1424453089; 9781424453085
• ISSN: 0271-4302; 2158-1525
• DOI: 10.1109/ISCAS.2010.5537703

A 7.7mW/1.0ns/1.35V digital delay locked loop has been proposed in this paper. The dual-DLL architecture with racing operation is adopted to achieve low power operation and low jitter, which is primarily caused by the length of the delay line. The merged dual coarse delay line (MDCDL) is employed for low power and high frequency operation. This DLL utilizes an OR-AND DCC for wide duty cycle correction capability. The proposed DLL for DDR3 SDRAM is fabricated by a 54nm DRAM process technology. Experimental results show that ±10% duty error of external clock can be corrected in less than 400 cycles locking time with 1.0GHz operation frequency at 1.35V.