The effect of metal foil tape degradation on the long-term reliability of PV modules
A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is based mainly on field failure and repair times, it can...
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Published in | 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) pp. 000923 - 000928 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.06.2009
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Subjects | |
Online Access | Get full text |
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Summary: | A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is based mainly on field failure and repair times, it cannot currently be used to accurately predict end-of-life. In order to be truly predictive, physics-informed degradation processes and failure mechanisms need to be included in the model. This paper describes accelerated life testing of metal foil tapes used in thin-film PV modules, and how tape joint degradation, a possible failure mode, can be incorporated into the model. |
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ISBN: | 1424429498 9781424429493 |
ISSN: | 0160-8371 |
DOI: | 10.1109/PVSC.2009.5411140 |