The effect of metal foil tape degradation on the long-term reliability of PV modules

A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is based mainly on field failure and repair times, it can...

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Bibliographic Details
Published in2009 34th IEEE Photovoltaic Specialists Conference (PVSC) pp. 000923 - 000928
Main Authors Sorensen, N.R., Quintana, M.A., Puskar, J.D., Lucero, S.J.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.06.2009
Subjects
Degradation
Failure analysis
Laboratories
Life estimation
Life testing
Photovoltaic systems
Predictive models
Qualifications
Solar power generation
Transistors
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Summary:A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is based mainly on field failure and repair times, it cannot currently be used to accurately predict end-of-life. In order to be truly predictive, physics-informed degradation processes and failure mechanisms need to be included in the model. This paper describes accelerated life testing of metal foil tapes used in thin-film PV modules, and how tape joint degradation, a possible failure mode, can be incorporated into the model.
ISBN:1424429498
9781424429493
ISSN:0160-8371
DOI:10.1109/PVSC.2009.5411140