A new approach of a precise electric modeling of the semiconductors and dielectrics

A new method is developed in this work, to seek precise and simple electric models of physical samples. This technique is based on the decomposition of the electric impedance in a series of the elementary electrical circuits. Algorithm and software programs are developed to estimate the order and th...

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Bibliographic Details
Published in2009 International Conference on Microelectronics - ICM pp. 232 - 235
Main Authors Malaoui, A., Bendada, E., Mabrouki, M., Ankrim, M., Quotb, K.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.12.2009
Subjects
Binary search trees
Ceramics
Circuit testing
Dielectrics
Electric modeling
Electric resistance
Immune system
Impedance
Instruments
LVM algorithm
Mathematical model
RLC circuits
RLC-circuit
semiconductor
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Summary:A new method is developed in this work, to seek precise and simple electric models of physical samples. This technique is based on the decomposition of the electric impedance in a series of the elementary electrical circuits. Algorithm and software programs are developed to estimate the order and the number of these basic circuits. Tests are applied on a BST ceramics and Schottky junction. The founding electric models are compared with other models, often used in the literature. Interesting results are observed on the level of the statistical errors and the various significant elements of the models.
ISBN:9781424458141
1424458145
ISSN:2159-1660
DOI:10.1109/ICM.2009.5418644