A new approach of a precise electric modeling of the semiconductors and dielectrics
A new method is developed in this work, to seek precise and simple electric models of physical samples. This technique is based on the decomposition of the electric impedance in a series of the elementary electrical circuits. Algorithm and software programs are developed to estimate the order and th...
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Published in | 2009 International Conference on Microelectronics - ICM pp. 232 - 235 |
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Main Authors | , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.12.2009
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Subjects | |
Online Access | Get full text |
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Summary: | A new method is developed in this work, to seek precise and simple electric models of physical samples. This technique is based on the decomposition of the electric impedance in a series of the elementary electrical circuits. Algorithm and software programs are developed to estimate the order and the number of these basic circuits. Tests are applied on a BST ceramics and Schottky junction. The founding electric models are compared with other models, often used in the literature. Interesting results are observed on the level of the statistical errors and the various significant elements of the models. |
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ISBN: | 9781424458141 1424458145 |
ISSN: | 2159-1660 |
DOI: | 10.1109/ICM.2009.5418644 |