New design of transient-noise detection circuit with SCR device for system-level ESD protection

A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successf...

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Bibliographic Details
Published in10th IEEE International NEWCAS Conference pp. 81 - 84
Main Authors Ming-Dou Ker, Wan-Yen Lin
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.06.2012
Subjects
CMOS integrated circuits
Electrostatic discharges
Microprogramming
Substrates
System-on-a-chip
Thyristors
Transient analysis
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Summary:A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level ESD-induced electrical transient events. The detection output can be cooperated with firmware operation to automatically execute system recovery procedure, therefore the immunity of microelectronic systems against system-level ESD test can be effectively improved.
ISBN:1467308579
9781467308571
DOI:10.1109/NEWCAS.2012.6328961