Parasitic bipolar effects leading to on-state breakdown in 2D-MESFETs

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Bibliographic Details
Published in27th European Solid-State Device Research Conference pp. 724 - 727
Main Authors Meneghesso, G., Neviani, A., Pavesi, M., Hurt, M., Peatman, W.C.B., Shur, M., Canali, C., Zanoni, E.
Format Conference Proceeding
LanguageEnglish
Published Editions Frontieres 1997
Subjects
Decision support systems
Electric breakdown
Electroluminescent devices
Electrons
FETs
Geometry
Impact ionization
MESFETs
Performance evaluation
Temperature
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ISBN:2863322214
9782863322215
DOI:10.1109/ESSDERC.1997.194531