Techniques for the diagnosis of switching circuit failures

In 2.12 minutes an IBM 7090 program found four input tests (for an 8-input parity check circuit) whose outcome determines whether any one of 102 possible failures occurred. For any single-output combinational circuit, with no more than 35 input variables, the program computes the set of all inputs d...

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Bibliographic Details
Published in2nd Annual Symposium on Switching Circuit Theory and Logical Design (SWCT 1961) pp. 152 - 160
Main Authors Galey, J. M., Norby, R. E., Roth, J. P.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.1961
Subjects
Switching circuits
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DOI10.1109/FOCS.1961.33

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Summary:In 2.12 minutes an IBM 7090 program found four input tests (for an 8-input parity check circuit) whose outcome determines whether any one of 102 possible failures occurred. For any single-output combinational circuit, with no more than 35 input variables, the program computes the set of all inputs detecting a given failure - the essential novelty of the method. These sets, one for each failure, are then Processed to find a (small) subset of tests which detect any failure. The underlying method extends to the diagnosis of circuits with feedback.
DOI:10.1109/FOCS.1961.33