Investigations of secondary electron emission from boron doped diamond films grown by MPCVD

A high secondary yield of 18.3 at 1KeV primary beam energy was found, with the B-doped diamond sample left in air for weeks and subject to no treatment prior to the measurement. Oxidation treatment destroys negative electron affinity (NEA) whereas heating in vacuum substantially regains NEA.

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Bibliographic Details
Published inIVESC 2012 pp. 313 - 314
Main Authors Ding, M. Q., Lili Li, Jinjun Feng, Yujuan Gao, Qilue Chen, Wensheng Shao
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.04.2012
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Summary:A high secondary yield of 18.3 at 1KeV primary beam energy was found, with the B-doped diamond sample left in air for weeks and subject to no treatment prior to the measurement. Oxidation treatment destroys negative electron affinity (NEA) whereas heating in vacuum substantially regains NEA.
ISBN:1467303682
9781467303682
DOI:10.1109/IVESC.2012.6264187