A Pseudo-Boolean Technique for Generating Compact Transition Tests with All-Output-Propagation Properties

This paper presents a technique for deriving a test set that detects each transition fault at all the reachable outputs from the fault site. It is known that such tests, which are called all-output-propagation (AOP) ones, can enhance the detectability of un-modeled defects. In order to generate comp...

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Bibliographic Details
Published in2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications pp. 293 - 296
Main Authors Iwagaki, T., Kaneko, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.01.2010
Subjects
all-output-propagation (AOP)
Electronic equipment testing
pseudo-Boolean model
test set reduction
transition fault
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Summary:This paper presents a technique for deriving a test set that detects each transition fault at all the reachable outputs from the fault site. It is known that such tests, which are called all-output-propagation (AOP) ones, can enhance the detectability of un-modeled defects. In order to generate compact AOP tests, pseudo-Boolean (0-1 integer programming) model is introduced in this paper. Moreover, a simple and reasonable heuristic way is also introduced to reduce the size of AOP tests efficiently.It is shown that the proposed method can generate compact AOP tests in a reasonable amount of test generation time through some experiments.
ISBN:9781424460250
1424460255
0769539785
9780769539782
DOI:10.1109/DELTA.2010.58