Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit
We design a low-voltage high-sensitivity random-process-variations sensor using an on-chip calibration circuit for improved accuracy. The sensor features a replica-biasing circuit that compensates global PVT variations and maintains sensitivity for robust operation. Measurement results from 90 nm te...
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Published in | 2010 IEEE International Solid-State Circuits Conference - (ISSCC) pp. 186 - 187 |
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Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.02.2010
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Subjects | |
Online Access | Get full text |
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Summary: | We design a low-voltage high-sensitivity random-process-variations sensor using an on-chip calibration circuit for improved accuracy. The sensor features a replica-biasing circuit that compensates global PVT variations and maintains sensitivity for robust operation. Measurement results from 90 nm test hip demonstrate the effectiveness of the sensor. |
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ISBN: | 1424460336 9781424460335 |
ISSN: | 0193-6530 2376-8606 |
DOI: | 10.1109/ISSCC.2010.5433991 |