Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit

We design a low-voltage high-sensitivity random-process-variations sensor using an on-chip calibration circuit for improved accuracy. The sensor features a replica-biasing circuit that compensates global PVT variations and maintains sensitivity for robust operation. Measurement results from 90 nm te...

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Bibliographic Details
Published in2010 IEEE International Solid-State Circuits Conference - (ISSCC) pp. 186 - 187
Main Authors Meterelliyoz, M., Goel, A., Kulkarni, J.P., Roy, K.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.02.2010
Subjects
Calibration
Circuits
Low voltage
Random processes
Robustness
Semiconductor device measurement
Sensor phenomena and characterization
Switches
Testing
Threshold voltage
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Summary:We design a low-voltage high-sensitivity random-process-variations sensor using an on-chip calibration circuit for improved accuracy. The sensor features a replica-biasing circuit that compensates global PVT variations and maintains sensitivity for robust operation. Measurement results from 90 nm test hip demonstrate the effectiveness of the sensor.
ISBN:1424460336
9781424460335
ISSN:0193-6530
2376-8606
DOI:10.1109/ISSCC.2010.5433991