Combining Force Histogram and Discrete Lines to Extract Dashed Lines

A new method to extract dashed lines in technical document is proposed in this paper by combining force histogram and discrete lines. The aim is to study the spatial location of couples of connected components using force histogram and to refine the recognition by considering surrounding discrete li...

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Bibliographic Details
Published in2010 20th International Conference on Pattern Recognition pp. 1574 - 1577
Main Authors Debled-Rennesson, I, Wendling, L
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2010
Subjects
dashed lines
discrete line
Force
force histogram
Histograms
Kernel
Noise
Shape
Skeleton
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Summary:A new method to extract dashed lines in technical document is proposed in this paper by combining force histogram and discrete lines. The aim is to study the spatial location of couples of connected components using force histogram and to refine the recognition by considering surrounding discrete lines. This new model is fast and it allows a good extraction of occulted patterns in presence of noise. Efficient common methods require several thresholds to process with technical documents. The proposed method requires only few thresholds which can be automatically set from data.
ISBN:1424475422
9781424475421
ISSN:1051-4651
2831-7475
DOI:10.1109/ICPR.2010.389