Overcoming pHEMT Linearity Dependence on Fundamental Input Tuning by Digital Pre-Distortion

In order to achieve highest possible gain and lowest input reflection coefficient, a conjugate match at the input of power transistors is desired. Unfortunately, as will be shown in this paper, such an input termination is not adequate for best linear performance of pHEMT power transistors operated...

Full description

Saved in:
Bibliographic Details
Published in2007 IEEE/MTT-S International Microwave Symposium pp. 1067 - 1070
Main Authors Bokatius, M., Lefevre, M., Miller, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.06.2007
Subjects
Online AccessGet full text

Cover

Loading…
Abstract In order to achieve highest possible gain and lowest input reflection coefficient, a conjugate match at the input of power transistors is desired. Unfortunately, as will be shown in this paper, such an input termination is not adequate for best linear performance of pHEMT power transistors operated in class AB. Therefore, these parameters need to be traded off against each other, if the device is used as a stand alone amplification stage. The use of digital pre-distortion allows operation of the transistor at best gain, input return loss, and linearity simultaneously.
AbstractList In order to achieve highest possible gain and lowest input reflection coefficient, a conjugate match at the input of power transistors is desired. Unfortunately, as will be shown in this paper, such an input termination is not adequate for best linear performance of pHEMT power transistors operated in class AB. Therefore, these parameters need to be traded off against each other, if the device is used as a stand alone amplification stage. The use of digital pre-distortion allows operation of the transistor at best gain, input return loss, and linearity simultaneously.
Author Miller, M.
Bokatius, M.
Lefevre, M.
Author_xml – sequence: 1
  givenname: M.
  surname: Bokatius
  fullname: Bokatius, M.
  organization: Freescale Semicond. Inc., Tempe
– sequence: 2
  givenname: M.
  surname: Lefevre
  fullname: Lefevre, M.
  organization: Freescale Semicond. Inc., Tempe
– sequence: 3
  givenname: M.
  surname: Miller
  fullname: Miller, M.
  organization: Freescale Semicond. Inc., Tempe
BookMark eNpFUN1KwzAYjTrBOfcA4k1eoPP7kjRJL2U_brAxwYKKFyNrv47Ilpa2E_b2dih4deD8wTm3rBfKQIzdI4wQIXlcvb1-rEYCwIykBWHMBbtFJZQCbW1yyfoiNjoyAvXVv2Cgx_qAKom0it9v2LBpvgAAjVZoTJ99rr-pzsqDDztezaerlC99IFf79sQnVFHIKWTEy8Bnx5C7A4XW7fkiVMeWp8dwjm07p9_5M_9SUzTxTVvWrS_DHbsu3L6h4R8OWDqbpuN5tFw_L8ZPy8gn0EYiw9yJAozVUrocizjLldbdYplsrcUCLGhjXQdxkUvhdKZMdhZRdzcIOWAPv7WeiDZV7Q-uPm2U0AoQ5Q8l3le3
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/MWSYM.2007.380277
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Xplore
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 1424406889
9781424406883
EISSN 2576-7216
EndPage 1070
ExternalDocumentID 4264011
Genre orig-research
GroupedDBID -~X
29I
6IE
6IF
6IH
6IK
6IL
6IM
6IN
AAJGR
ABPPZ
ACGFS
ADZIZ
AFFNX
AI.
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IPLJI
JC5
M43
OCL
RIE
RIG
RIL
RIO
RNS
VH1
ID FETCH-LOGICAL-i90t-2c1da2f078633ad1f5cd46610939b881f080678a0805fd32a6c47c939b1680223
IEDL.DBID RIE
ISBN 1424406870
9781424406876
ISSN 0149-645X
IngestDate Wed Jun 26 19:34:50 EDT 2024
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i90t-2c1da2f078633ad1f5cd46610939b881f080678a0805fd32a6c47c939b1680223
PageCount 4
ParticipantIDs ieee_primary_4264011
PublicationCentury 2000
PublicationDate 2007-June
PublicationDateYYYYMMDD 2007-06-01
PublicationDate_xml – month: 06
  year: 2007
  text: 2007-June
PublicationDecade 2000
PublicationTitle 2007 IEEE/MTT-S International Microwave Symposium
PublicationTitleAbbrev MWSYM
PublicationYear 2007
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0001764177
ssj0005816
Score 1.6779907
Snippet In order to achieve highest possible gain and lowest input reflection coefficient, a conjugate match at the input of power transistors is desired....
SourceID ieee
SourceType Publisher
StartPage 1067
SubjectTerms Error correction
FETs
field effect transistors
Impedance matching
Linearity
microwave amplifiers
MIM capacitors
nonlinear circuits
nonlinearities
Performance gain
PHEMTs
Plastic packaging
Power amplifiers
Power harmonic filters
Power transistors
Title Overcoming pHEMT Linearity Dependence on Fundamental Input Tuning by Digital Pre-Distortion
URI https://ieeexplore.ieee.org/document/4264011
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELZKJ1h4tIi3PDDi1o4dO5lpq4IUQCKIIobKiR1UIaUVShZ-Pec8WkAMTImTKA_rojvf3fd9CF0ynXGa6ZQwwxURNpNEUxmSwLNc00xZm1Rsn3dy-iRuZ_6sg67WWBhrbdV8Zgdut6rlm2VaulTZ0Hlv6oC8WyoMa6zWJp-ipGBKbdo7gkr21K0AiBT-rAV1UQkW2nI9NWPZlDsZDYfR8-NLVFMb8sAVOH_IrlReZ7KLovZ962aT90FZJIP08xeV438_aA_1N_g-_LD2XPuoY_MDtPONmrCHXu_BxsEaYYBX03EUY1i1wl8BQTseNcK5cJdljicOS1JLBOCbfFUWOC5dsgUncOXizYmSwMMsGVWEJM4O-iiejOPrKWmEGMgipAXxUma0l0EwITnXhmV-aoR0PO08TIKAZRB1gs_TsPEzwz0tU6FSd5JJh-Tlh6ibL3N7hLALmKgwVkmWwFKSJyqgRqSO-EtTcKjHqOdmab6qqTbmzQSd_H34FG237XuUnaFu8VHac4gRiuSiMo4vhKKy6A
link.rule.ids 310,311,783,787,792,793,799,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELYqGICFR4t444ERt3acOMlMW6XQFCSCKGKonMRGFVJaoWTh13POowXEwJQ4ifKwLrrPd_d9h9AVk5pTLRPCUu4SW2lBJBU-8SzFJdWuUnGp9jkRwZN9O3WmLXS94sIopcriM9U1u2UuP10khQmV9Yz3pobIuwm42hMVW2sdUXGFzVx3XeDhlY1PzRqACNuZNrQuKsBGG7WneizqhCejfi98fnwJK3FD7pkU54_GK6XfGe6isHnjqtzkvVvkcTf5_CXm-N9P2kOdNcMPP6x81z5qqewA7XwTJ2yj13uwcrBHGOBlMAgjDOtW-C8AtuN-3ToX7rLI8NCwSaomAXiULYscR4UJt-AYrpy_mbYk8DBF-qUkibGEDoqGg-gmIHUrBjL3aU6shKXS0gAnBOcyZdpJUlsYpXbux57HNOBO8HoSNo5OuSVFYruJOcmE4fLyQ7SRLTJ1hLCBTNROlStYDItJHrseTe3ESH9JCi71GLXNLM2WldjGrJ6gk78PX6KtIArHs_FocneKtptiPsrO0Eb-UahzQAx5fFEayhcXcLYz
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2007+IEEE%2FMTT-S+International+Microwave+Symposium&rft.atitle=Overcoming+pHEMT+Linearity+Dependence+on+Fundamental+Input+Tuning+by+Digital+Pre-Distortion&rft.au=Bokatius%2C+M.&rft.au=Lefevre%2C+M.&rft.au=Miller%2C+M.&rft.date=2007-06-01&rft.pub=IEEE&rft.isbn=9781424406876&rft.issn=0149-645X&rft.eissn=2576-7216&rft.spage=1067&rft.epage=1070&rft_id=info:doi/10.1109%2FMWSYM.2007.380277&rft.externalDocID=4264011
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0149-645X&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0149-645X&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0149-645X&client=summon