Probabilistic Error Propagation Modeling in Logic Circuits

Recent study has shown that accurate knowledge of the false negative rate (FNR) of tests can significantly improve the diagnostic accuracy of spectrum-based fault localization. To understand the principles behind FNR modeling in this paper we study three error propagation probability (EPP) modeling...

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Bibliographic Details
Published in2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops pp. 617 - 623
Main Authors Gupta, S., van Gemund, A. J. C., Abreu, R.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.03.2011
Subjects
Circuit faults
Computational modeling
Integrated circuit modeling
Logic gates
Numerical models
Predictive models
Probabilistic logic
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Summary:Recent study has shown that accurate knowledge of the false negative rate (FNR) of tests can significantly improve the diagnostic accuracy of spectrum-based fault localization. To understand the principles behind FNR modeling in this paper we study three error propagation probability (EPP) modeling approaches applied to a number of logic circuits from the 74XXX/ISCAS-85 benchmark suite. Monte Carlo simulations for random injected faults show that a deterministic approach that models gate behavior provides high accuracy (O(1%)), while probabilistic approaches that abstract from gate modeling generate higher prediction errors (O(10%)), which increase with the number of injected faults.
ISBN:9781457700194
1457700190
DOI:10.1109/ICSTW.2011.40