Probabilistic Error Propagation Modeling in Logic Circuits
Recent study has shown that accurate knowledge of the false negative rate (FNR) of tests can significantly improve the diagnostic accuracy of spectrum-based fault localization. To understand the principles behind FNR modeling in this paper we study three error propagation probability (EPP) modeling...
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Published in | 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops pp. 617 - 623 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.03.2011
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Subjects | |
Online Access | Get full text |
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Summary: | Recent study has shown that accurate knowledge of the false negative rate (FNR) of tests can significantly improve the diagnostic accuracy of spectrum-based fault localization. To understand the principles behind FNR modeling in this paper we study three error propagation probability (EPP) modeling approaches applied to a number of logic circuits from the 74XXX/ISCAS-85 benchmark suite. Monte Carlo simulations for random injected faults show that a deterministic approach that models gate behavior provides high accuracy (O(1%)), while probabilistic approaches that abstract from gate modeling generate higher prediction errors (O(10%)), which increase with the number of injected faults. |
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ISBN: | 9781457700194 1457700190 |
DOI: | 10.1109/ICSTW.2011.40 |