SEE test results on a commercially designed and manufactured NOR FLASH

• Published in: 2011 12th European Conference on Radiation and Its Effects on Components and Systems pp. 950 - 953
• Main Authors: Jordan, A., Farris, T., Hafer, C., Von Thun, M., Benedetto, J.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.09.2011
• Subjects: Electronic mail; heavy ions; NOR FLASH memory; Single Event Effects; Single event upset; Springs; Testing; Tin; Xenon

The SEE performance will be presented on a commercial designed/manufactured 64Mb NOR FLASH. The product is SEL immune and no upsets occurred at a LET = 100 either unbiased or with a static bias.