SEE test results on a commercially designed and manufactured NOR FLASH

The SEE performance will be presented on a commercial designed/manufactured 64Mb NOR FLASH. The product is SEL immune and no upsets occurred at a LET = 100 either unbiased or with a static bias.

Saved in:
Bibliographic Details
Published in2011 12th European Conference on Radiation and Its Effects on Components and Systems pp. 950 - 953
Main Authors Jordan, A., Farris, T., Hafer, C., Von Thun, M., Benedetto, J.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2011
Subjects
Electronic mail
heavy ions
NOR FLASH memory
Single Event Effects
Single event upset
Springs
Testing
Tin
Xenon
Online AccessGet full text

Cover

More Information
Summary:The SEE performance will be presented on a commercial designed/manufactured 64Mb NOR FLASH. The product is SEL immune and no upsets occurred at a LET = 100 either unbiased or with a static bias.
ISBN:9781457705854
1457705850
ISSN:0379-6566
DOI:10.1109/RADECS.2011.6131337