Structural and optical properties of Cd1−xZnxTe thick films with high zn concentrations

Thick polycrystalline Cd 1-x Zn x Te films were deposited by the close spaced vacuum sublimation method. Study of structural and optical properties was carried out by X-ray diffraction, Raman spectroscopy, and low temperature photoluminescence. Obtained results allowed to estimate phase composition...

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Published in2017 IEEE 7th International Conference Nanomaterials: Application & Properties (NAP) pp. 02MAN05-1 - 02MAN05-5
Main Authors Znamenshchykov, Y. V., Kosyak, V. V., Opanasyuk, A. S., Kolesnyk, M. M., Fochuk, P. M., Cerskus, A.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2017
Subjects
Crystal structure
Crystals
Diffraction
Lattices
Optical films
Photoluminescence
Raman spectroscopy
Semiconducting ternary compounds
X-ray diffraction
X-ray scattering
Zinc
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Summary:Thick polycrystalline Cd 1-x Zn x Te films were deposited by the close spaced vacuum sublimation method. Study of structural and optical properties was carried out by X-ray diffraction, Raman spectroscopy, and low temperature photoluminescence. Obtained results allowed to estimate phase composition of the films, as well as to calculate the values of band gap of the films, which was 1.97 eV and 2.13 eV for samples with x=0.48 and x=0.65 respectively.
DOI:10.1109/NAP.2017.8190350