Delay Time and Power Supply Current Characteristics of CMOS Inverter Broken by Intentional High Power Microwave

This paper examined delay time and breakdown effects of CMOS inverter by impact of high power microwave. The experiments employed a waveguide and a magnetron to study the supply current characteristics of CMOS inverter broken by high power microwave. The CMOS inverters were composed of a LED circuit...

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Bibliographic Details
Published in2007 Asia-Pacific Microwave Conference pp. 1 - 4
Main Authors Sun-Mook Hwang, Joo-Il Hong, Seung-Moon Han, Chang-Su Huh, Uk-Youl Huh, Jin-Soo Choi
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.12.2007
Subjects
Breakdown
Circuits
CMOS
Current supplies
Delay effects
Delay time
Electric breakdown
Electronic equipment
High Power Microwave(HPM)
Impedance
Inverters
Light emitting diodes
Microwave devices
Power supplies
Supply current
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Summary:This paper examined delay time and breakdown effects of CMOS inverter by impact of high power microwave. The experiments employed a waveguide and a magnetron to study the supply current characteristics of CMOS inverter broken by high power microwave. The CMOS inverters were composed of a LED circuit for visual discernment. Also CMOS inverters broken by high power microwave were observed with supply current and delay time. When power supply current increased 2.14 times for normal current at the 10 kV/m, the CMOS inverter was broken by Latch-up. Also the CMOS inverter broken by Latch-up returned to function of original condition because parasitic impedance inside chip was increased with time. Based on the result, CMOS devices were applied to the data which understood microwave effects of electronic equipment.
ISBN:9781424407484
1424407486
ISSN:2165-4727
2165-4743
DOI:10.1109/APMC.2007.4554704