Cost-driven statistical analysis for selection of alternative measurements of analog circuits

In this paper, we introduce a new method for improving the use of Alternative Measurements Strategy for analog circuit testing. The goal is to reduce the test cost by selecting the cheapest set of measurements that do not bring redundant information about the state of the circuit, without reducing t...

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Bibliographic Details
Published in2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS) pp. 104 - 107
Main Authors Verdy, Matthieu, Ratiu, Alin, Morche, Dominique, De Foucauld, Emeric, Lesecq, Suzanne, Mallet, Jean-Pascal, Mayor, Cedric
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.12.2014
Subjects
Accuracy
Built-in Test
Data mining
Feature extraction
Indirect measures selection
Integrated circuit modeling
Mars
Model classification
Modeling techniques
Monte-Carlo simulation
System-on-chip
Tuning
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Summary:In this paper, we introduce a new method for improving the use of Alternative Measurements Strategy for analog circuit testing. The goal is to reduce the test cost by selecting the cheapest set of measurements that do not bring redundant information about the state of the circuit, without reducing test coverage. The proposed method consists in finding a subset of a given set of parameters which explains the dispersion of the circuit performances. The efficiency of the proposed approach is demonstrated on a critical example using continuous-time A/D conversion.
DOI:10.1109/ICECS.2014.7049932