LEON 3FT Processor Radiation Effects Data

Special SEU test software is used to monitor the single-bit per word corrected errors in the internal SRAM of the LEON 3 fault tolerant processor. SEL and TID results are discussed.

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Bibliographic Details
Published in2009 IEEE Radiation Effects Data Workshop pp. 148 - 151
Main Authors Hafer, C., Griffith, S., Guertin, S., Nagy, J., Sievert, F., Gaisler, J., Habinc, S.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2009
Subjects
Fault tolerance
Monitoring
Protection
Radiation effects
Random access memory
Registers
Single event upset
Springs
Telephony
Testing
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Summary:Special SEU test software is used to monitor the single-bit per word corrected errors in the internal SRAM of the LEON 3 fault tolerant processor. SEL and TID results are discussed.
ISBN:9781424450923
1424450926
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2009.5336299