Quantitative measurement and modeling of spontaneous emission efficiency of forward biased multi-junction solar cells

The spontaneous emission efficiency (η rad ) of the subcells in a multi-junction solar cell under forward bias yields information about the subcell material quality. Electroluminesence measurement, calibrated with a technique that takes advantage of the luminescence coupling between subcells, is use...

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Bibliographic Details
Published in2011 37th IEEE Photovoltaic Specialists Conference pp. 001721 - 001725
Main Authors Lim, Swee H., Jing-Jing Li, Allen, Charles R., Yong-Hang Zhang
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.06.2011
Subjects
Current measurement
Indium gallium arsenide
Luminescence
Photoconductivity
Photovoltaic cells
Semiconductor device measurement
Spontaneous emission
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Summary:The spontaneous emission efficiency (η rad ) of the subcells in a multi-junction solar cell under forward bias yields information about the subcell material quality. Electroluminesence measurement, calibrated with a technique that takes advantage of the luminescence coupling between subcells, is used to determine η rad as a function of injection current. The InGaAs subcell's η rad is also fitted to a device model using the PC1D drift-diffusion simulation software to extract the SRH lifetime of the p-n junction base region.
ISBN:9781424499663
1424499666
ISSN:0160-8371
DOI:10.1109/PVSC.2011.6186286