An in-situ temperature-sensing interface based on a SAR ADC in 45nm LP digital CMOS for the frequency-temperature compensation of crystal oscillators

A crystal-temperature-sensing interface based on an in-situ thermistor and a 1 V 12b digitally calibrated SAR ADC in 45 nm LP CMOS is presented. The digitized temperature readings are used by an LUT-based compensation scheme to stabilize the frequency of a crystal oscillator through digital capaciti...

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Bibliographic Details
Published in2010 IEEE International Solid-State Circuits Conference - (ISSCC) pp. 316 - 317
Main Authors Zhenning Wang, Lin, R., Gordon, E., Lakdawala, H., Carley, L.R., Jensen, J.C.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.02.2010
Subjects
Calibration
Capacitors
Clocks
Frequency
Oscillators
Sampling methods
Switches
Temperature sensors
Thermistors
Voltage
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Summary:A crystal-temperature-sensing interface based on an in-situ thermistor and a 1 V 12b digitally calibrated SAR ADC in 45 nm LP CMOS is presented. The digitized temperature readings are used by an LUT-based compensation scheme to stabilize the frequency of a crystal oscillator through digital capacitive load tuning to achieve ±0.5 ppm stability over a -10-to-80°C temperature range.
ISBN:1424460336
9781424460335
ISSN:0193-6530
2376-8606
DOI:10.1109/ISSCC.2010.5433897