Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis

Saved in:
Bibliographic Details
Published inThe Fifth International Conference on VLSI Design pp. 339 - 340
Main Authors Dharchoudhury, A., Kang, S.M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1992
Subjects
Analytical models
Circuit analysis
Circuit optimization
Circuit simulation
Computational modeling
Context modeling
Performance analysis
Random variables
Response surface methodology
Surface treatment
Online AccessGet full text

Cover

More Information
ISBN:9780818624650
0818624655
ISSN:1063-9667
2380-6923
DOI:10.1109/ICVD.1992.658079