A new test scheduling algorithm for VLSI systems

Presents a new test scheduling algorithm based on a new heuristic approach. A new concept of time zone tree has been proposed and the algorithm builds up the tree based on a heuristic cost function. The performance of the algorithm has been compared with existing algorithms and it demonstrates encou...

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Bibliographic Details
Published in[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design pp. 148 - 153
Main Authors Garg, M., Basu, A., Wilson, T.C., Banerji, D.K., Majithia, J.C.
Format Conference Proceeding
LanguageEnglish
Published IEEE Comput. Soc. Press 1991
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Summary:Presents a new test scheduling algorithm based on a new heuristic approach. A new concept of time zone tree has been proposed and the algorithm builds up the tree based on a heuristic cost function. The performance of the algorithm has been compared with existing algorithms and it demonstrates encouraging results.< >
ISBN:9780818621253
0818621257
DOI:10.1109/ISVD.1991.185108