Desktop Computer Models for Coplanar Lines Laid on Semiconductor Layers for C.A.D

For CAD simulation, it is necessary to determine the frequency behaviour of coplanar lines laid on semiconductor substrates. Exact analysis can be performed by using numerical technics such as S.D.A. or Mode Matching. However such analysis can not be included in C.A.D. programs. For this purpose, we...

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Bibliographic Details
Published in1988 18th European Microwave Conference pp. 1145 - 1149
Main Authors Delrue, R., Seguinot, C., Pribetich, P., Kennis, P.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.1988
Subjects
Capacitance
Computational modeling
Conductivity
Coplanar transmission lines
Dielectric substrates
Frequency
Inductance
Metallization
Propagation losses
Semiconductivity
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Summary:For CAD simulation, it is necessary to determine the frequency behaviour of coplanar lines laid on semiconductor substrates. Exact analysis can be performed by using numerical technics such as S.D.A. or Mode Matching. However such analysis can not be included in C.A.D. programs. For this purpose, we present an original model for coplanar lines laid on semiconductor substrates, which take into account both the influence of thickness metallization and dielectric cap layer. The validity of our models is tested by comparison with mode matching and S.D.A. results.
DOI:10.1109/EUMA.1988.333963