C band ferrite microstrip limiter

A microstrip line on a polycrystalline yttrium iron garnet substrate was measured as a function of incident microwave power level to determine power limiting. Properties acceptable to system designers were found for the low level insertion loss, recovery time, temperature performance and response to...

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Bibliographic Details
Published in1997 IEEE MTT-S International Microwave Symposium Digest Vol. 2; pp. 1125 - 1126 vol.2
Main Author Green, J.J.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1997
Subjects
Ferrites
Garnets
Insertion loss
Iron
Microstrip
Microwave measurements
Power measurement
Pulse modulation
Temperature
Yttrium
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Summary:A microstrip line on a polycrystalline yttrium iron garnet substrate was measured as a function of incident microwave power level to determine power limiting. Properties acceptable to system designers were found for the low level insertion loss, recovery time, temperature performance and response to a frequency modulated pulse.
ISBN:9780780338142
0780338146
ISSN:0149-645X
2576-7216
DOI:10.1109/MWSYM.1997.602999