Extraction of circuit models for substrate cross-talk

• Published in: Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) pp. 199 - 206
• Main Authors: Smedes, T., van der Meijs, N.P., van Genderen, A.J.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 1995
• Subjects: Analytical models; Boundary element methods; Circuit simulation; Coupling circuits; Design automation; Integrated circuit interconnections; Integrated circuit technology; Mixed analog digital integrated circuits; Numerical analysis; Parasitic capacitance
• ISBN: 0818682000; 0818672137; 9780818672132; 9780818682001
• ISSN: 1063-6757; 1092-3152; 1558-2434
• DOI: 10.1109/ICCAD.1995.480013

An increasingly urgent topic for the realization of densely packed (mixed signal) integrated circuits is prevention of cross-talk via the substrate. The paper proposes a boundary element method (BEM) for calculating an admittance matrix for the substrate in order to analyze the parasitic coupling during layout verification. In contrast to standard BE methods, we propose a Green's function which is specific to the domain and the problem. This allows minimal discretization and a direct extraction of circuit models for the cross-talk. The extraction can be combined with an efficient model reduction technique to obtain more simple, yet accurate models for the cross-talk. The complete extraction process has a linear time complexity and a constant memory usage. The method is fully implemented and integrated in an existing layout-to-circuit extractor.