Extraction of circuit models for substrate cross-talk
An increasingly urgent topic for the realization of densely packed (mixed signal) integrated circuits is prevention of cross-talk via the substrate. The paper proposes a boundary element method (BEM) for calculating an admittance matrix for the substrate in order to analyze the parasitic coupling du...
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Published in | Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) pp. 199 - 206 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1995
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Subjects | |
Online Access | Get full text |
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Summary: | An increasingly urgent topic for the realization of densely packed (mixed signal) integrated circuits is prevention of cross-talk via the substrate. The paper proposes a boundary element method (BEM) for calculating an admittance matrix for the substrate in order to analyze the parasitic coupling during layout verification. In contrast to standard BE methods, we propose a Green's function which is specific to the domain and the problem. This allows minimal discretization and a direct extraction of circuit models for the cross-talk. The extraction can be combined with an efficient model reduction technique to obtain more simple, yet accurate models for the cross-talk. The complete extraction process has a linear time complexity and a constant memory usage. The method is fully implemented and integrated in an existing layout-to-circuit extractor. |
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ISBN: | 0818682000 0818672137 9780818672132 9780818682001 |
ISSN: | 1063-6757 1092-3152 1558-2434 |
DOI: | 10.1109/ICCAD.1995.480013 |