Single event effect testing of the Intel 80386 family and the 80486 microprocessor

We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored.

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Bibliographic Details
Published inProceedings of the Third European Conference on Radiation and its Effects on Components and Systems pp. 263 - 269
Main Authors Moran, A., LaBel, K., Gates, M., Seidleck, C., McGraw, R., Broida, M., Firer, J., Sprehn, S.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1995
Subjects
Circuit testing
Clocks
Control systems
Coprocessors
Costs
Manufacturing processes
Microprocessors
NASA
Performance evaluation
Single event upset
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Summary:We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored.
ISBN:9780780330931
0780330935
DOI:10.1109/RADECS.1995.509788