7.7 Enterprise-grade 6x fast read and 5x highly reliable SSD with TLC NAND-flash memory for big-data storage

An enterprise-grade SSD with TLC (3b/cell) NAND Flash is presented with three techniques that achieve high speed and high reliability. Quick low-density parity-check (LDPC) reduces the read latency of 1Xnm TLC NAND Flash SSD by 83%. Dynamic V TH optimization and auto data recovery reduce the NAND Fl...

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Published in2015 IEEE International Solid State Circuits Conference (ISSCC) pp. 1 - 3
Main Authors Tokutomi, Tsukasa, Doi, Masafumi, Hachiya, Shogo, Kobayashi, Atsuro, Tanakamaru, Shuhei, Takeuchi, Ken
Format Conference Proceeding Journal Article
LanguageEnglish
Published IEEE 01.02.2015
Subjects
Automotive components
Automotive industry
Bit error rate
Circuits
Conferences
Data recovery
Dynamics
Error correction codes
Flash memories
High speed
Optimization
Parity check codes
Reliability
Sensors
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Summary:An enterprise-grade SSD with TLC (3b/cell) NAND Flash is presented with three techniques that achieve high speed and high reliability. Quick low-density parity-check (LDPC) reduces the read latency of 1Xnm TLC NAND Flash SSD by 83%. Dynamic V TH optimization and auto data recovery reduce the NAND Flash bit-error rate (BER) by 80% and 18%, respectively. These techniques can be implemented in the SSD controller without circuit overhead. No modification is required to the TLC NAND flash.
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SourceType-Conference Papers & Proceedings-2
ISBN:1479962236
9781479962235
ISSN:0193-6530
2376-8606
DOI:10.1109/ISSCC.2015.7062965