Heavy Ion-Induced SEE and 60Co TID effects testing on commercial logic devices

This paper presents the investigation of heavy-ion induced Single-Event Effects, and gamma ray induced Total Ionizing Dose effect on commercial logic devices including buffers and transceivers.

Saved in:
Bibliographic Details
Published in2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) pp. 1 - 5
Main Authors Kohler, P., Bosser, A., Rajkowski, T., Saigne, F., Wang, P. X., Sanchez, A., Puybusque, L., Gouyet, L.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.11.2020
Subjects
60 Co TID effects testing
commercial logic devices
gamma ray induced total ionizing dose effect
heavy ion-induced SEE
ion beam effects
Ions
logic circuits
logic testing
Monitoring
Radiation effects
radiation hardening (electronics)
Sensitivity
single-event effects
Temperature measurement
Temperature sensors
Transceivers
Online AccessGet full text

Cover

More Information
Summary:This paper presents the investigation of heavy-ion induced Single-Event Effects, and gamma ray induced Total Ionizing Dose effect on commercial logic devices including buffers and transceivers.
DOI:10.1109/REDW51883.2020.9325826