Probing Ferroelectric Domain Engineering in BiFeO3 Thin Films by Second Harmonic Generation

An optical probe of the ferroelectric domain distribution and manipulation in BiFeO3 thin films is reported using optical second harmonic generation. A unique relation between the domain distribution and its integral symmetry is established. The ferroelectric signature is even resolved when the film...

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Bibliographic Details
Published inAdvanced materials (Weinheim) Vol. 27; no. 33; pp. 4871 - 4876
Main Authors Trassin, Morgan, Luca, Gabriele De, Manz, Sebastian, Fiebig, Manfred
Format Journal Article
LanguageEnglish
Published Germany Blackwell Publishing Ltd 02.09.2015
Subjects
BiFeO3
domains
ferroelectric
magnetoelectric
multiferroic
scanning probe microscopy
second harmonic generation
ferroelectric
BiFeO3
multiferroic
scanning probe microscopy
second harmonic generation
magnetoelectric
domains
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Summary:An optical probe of the ferroelectric domain distribution and manipulation in BiFeO3 thin films is reported using optical second harmonic generation. A unique relation between the domain distribution and its integral symmetry is established. The ferroelectric signature is even resolved when the film is covered by a top electrode. The effect of voltage‐induced ferroelectric switching is imaged.
Bibliography:ETH FIRST laboratory
ark:/67375/WNG-6DT85D57-P
istex:59CE4E0D55492DC991F9C2EA05CD59EE6FFD2686
ArticleID:ADMA201501636
SNSF R'Equip Program - No. 206021-144988
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201501636