The influence of La-substitution on the micro-structure and ferroelectric properties of chemical-solution-deposited BiFeO3 thin films

La-substituted BiFeO3 (BFO) thin films were formed by depositing sol-gel solutions on Pt/Ti/SiO2/Si (1 0 0) structures. No secondary phase was observed by La-atom-substitution up to 20% in BFO thin films. The micro-structures of the films were changed with an increase in La concentration, which infl...

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Published inJournal of physics. D, Applied physics Vol. 40; no. 9; pp. 2705 - 2709
Main Authors Singh, S K, Maruyama, K, Ishiwara, H
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 07.05.2007
Institute of Physics
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Summary:La-substituted BiFeO3 (BFO) thin films were formed by depositing sol-gel solutions on Pt/Ti/SiO2/Si (1 0 0) structures. No secondary phase was observed by La-atom-substitution up to 20% in BFO thin films. The micro-structures of the films were changed with an increase in La concentration, which influenced the ferroelectric properties of the films. The dielectric constant of a BFO film was approximately 90 at 1 MHz and it increased to 125 in a 20% La-substituted BFO film, which was probably due to the size effect of grains. The substitution of La atoms in BFO films reduced the leakage current as well as remanent polarization. The leakage current contribution in the hysteresis loop was negligible when the loops were measured at above 20 kHz. The obtained saturated remanent polarization was 50 muC cm-2 in a 5% La-substituted BFO film at 100 kHz.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/40/9/004