Influence of the introduction and formation of artificial pinning centers on the transport properties of nanostructured Nb3Sn superconducting wires

The formation of nanostructures projected to act as pinning centers is presented as a highly promising technique for the transport properties optimization of superconductors. However, due to the necessity of nanometric dimensions of these pinning centers, the heat treatment (HT) profiles must be car...

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Bibliographic Details
Published inJournal of physics. Conference series Vol. 167; no. 1; p. 012012
Main Authors Silva, L B S Da, Rodrigues, C A, Bormio-Nunes, C, Jr, N F Oliveira, Jr, D Rodrigues
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.05.2009
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Summary:The formation of nanostructures projected to act as pinning centers is presented as a highly promising technique for the transport properties optimization of superconductors. However, due to the necessity of nanometric dimensions of these pinning centers, the heat treatment (HT) profiles must be carefully analyzed. The present work describes a methodology to optimize the HT profiles in respect to diffusion, reaction and formation of the superconducting phases. After the HT, samples were removed for micro structural characterization. Measurements of transport properties were performed to analyze the influence of the introduction of artificial pinning centers (APC) on the superconducting phase and to find the flux pinning mechanism acting in these wires. Fitting the volumetric pinning force vs. applied magnetic field (Fp vs. μoH) curves of transport properties, we could determine the type and influence of flux pinning mechanism acting in the global behavior of the samples. It was concluded that the maximum current densities were obtained when normal phases (due to the introduction of the APCs) are the most efficient pinning centers in the global behavior of the samples. The use of HT with profile 220°C/100h+575°C/50h+650°C/100h was found as the best treatment for these nanostructured superconducting wires.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/167/1/012012