Direct transition from the rhombohedral ferroelectric to the paraelectric phase in a (Ba,Sr)TiO3 thin film on a (111)MgO substrate

A heteroepitaxial (200 nm thick) (BST) thin film was deposited on a (111)MgO substrate using rf sputtering. X-ray diffraction examinations confirmed epitaxial growth and rhombohedral symmetry of the film ( and ) at room temperature. Polarized Raman spectra of the film were studied in the temperature...

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Published inEurophysics letters Vol. 112; no. 4; pp. 47001 - 47006
Main Authors Anokhin, A. S., Yuzyuk, Yu. I., Lyanguzov, N. V., Razumnaya, A. G., Stryukov, D. V., Bunina, O. A., Golovko, Yu. I., Shirokov, V. B., Mukhortov, V. M., El Marssi, M.
Format Journal Article
LanguageEnglish
Published Les Ulis EDP Sciences, IOP Publishing and Società Italiana di Fisica 01.11.2015
IOP Publishing
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Summary:A heteroepitaxial (200 nm thick) (BST) thin film was deposited on a (111)MgO substrate using rf sputtering. X-ray diffraction examinations confirmed epitaxial growth and rhombohedral symmetry of the film ( and ) at room temperature. Polarized Raman spectra of the film were studied in the temperature range from 100 to 420 K. In contrast to a BST thin film grown on (001)MgO, the observed linear temperature dependence of the squared soft mode frequency suggests the displacive character of the ferroelectric-paraelectric phase transition in a BST thin film on (111)MgO.
Bibliography:ark:/67375/80W-3JMG9FBS-3
publisher-ID:epl17524
istex:8A591F54D2F624C825AC2AD3D875754A873B74CD
ISSN:0295-5075
1286-4854
DOI:10.1209/0295-5075/112/47001