Effect of heat treatment on the NO2-sensing properties of sputter-deposited indium tin oxide thin films

Transparent conducting indium tin oxide (ITO) films were deposited onto glass substrates by radio-frequency magnetron sputtering at 648 K, under an oxygen partial pressure of 1 Pa. The effect of annealing on the electrical properties of the films was studied. Characterization of the coatings reveale...

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Bibliographic Details
Published inPhilosophical magazine letters Vol. 91; no. 10; pp. 682 - 689
Main Authors Vijayalakshmi, K., Pillay, Vasanthi V.
Format Journal Article
LanguageEnglish
Published Abingdon Taylor & Francis Group 01.10.2011
Taylor & Francis
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Summary:Transparent conducting indium tin oxide (ITO) films were deposited onto glass substrates by radio-frequency magnetron sputtering at 648 K, under an oxygen partial pressure of 1 Pa. The effect of annealing on the electrical properties of the films was studied. Characterization of the coatings revealed an electrical resistivity below 6.5 × 10 − 3  Ω cm. The ITO films deposited at 648 K were amorphous, while the crystallinity improved after annealing at 700 K. The surface morphology examined by scanning electron microscopy appears to be uniform over the entire surface area after annealing. The NO 2 -sensing properties of the ITO films were investigated and showed sensitivity at concentrations lower than 50 ppm, at a working temperature of 600 K.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0950-0839
1362-3036
DOI:10.1080/09500839.2011.608731