Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy

Conductive‐tip atomic force microscopy (C‐AFM) is a powerful tool for investigating the electrical characteristics of phase‐change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline...

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Bibliographic Details
Published inphysica status solidi (b) Vol. 249; no. 10; pp. 1945 - 1950
Main Authors Chang, Chia Min, Liu, Yen Ju, Tseng, Ming Lun, Chu, Nien-Nan, Huang, Ding-Wei, Mansuripur, Masud, Tsai, Din Ping
Format Journal Article
LanguageEnglish
Published Berlin WILEY-VCH Verlag 01.10.2012
WILEY‐VCH Verlag
Subjects
electronic data storage
materials and process characterization
optical recording
phase-change materials
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Summary:Conductive‐tip atomic force microscopy (C‐AFM) is a powerful tool for investigating the electrical characteristics of phase‐change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge2Sb2Te5 film.
Bibliography:istex:123C420CE57B9AB5BCBF78E450EBB64B3B23804D
ark:/67375/WNG-5J3HJ0Q6-L
ArticleID:PSSB201200356
Dedicated to Stanford R. Ovshinsky on the occasion of his 90th birthday
ISSN:0370-1972
1521-3951
DOI:10.1002/pssb.201200356