Charge compensating defects study of YbF3-doped BaF2 crystals using dielectric loss

• Published in: physica status solidi (b) Vol. 253; no. 2; pp. 397 - 403
• Main Authors: Nicoara, Irina, Stef, Marius
• Format: Journal Article
• Language: English
• Published: Blackwell Publishing Ltd 01.02.2016
• Subjects: BaF2; defects; dielectric relaxation; optical spectroscopy; ytterbium

YbF3‐doped BaF2 crystals with various concentrations of YbF3 (0.05, 0.1, 0.17, 0.2 mol%) have been grown using the conventional Bridgman method. Dielectric relaxation is used to study the charge compensating defects in BaF2 crystals with low YbF3 concentration. The optical absorption spectra reveal...