A simple linear technique for measuring the carrier-envelope offset phase of ultrashort pulses

A spectrally resolved multiple beam interferometer is capable for measuring the carrier envelope offset phase of ultrashort laser pulses with an accuracy of 70 mrad. The performance has been cross-calibrated with a conventional f-to-2f interferometer.

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Bibliographic Details
Published inCLEO: 2011 - Laser Science to Photonic Applications pp. 1 - 2
Main Authors Jojart, P., Borzsonyi, A., Koke, S., Gorbe, M., Osvay, K.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2011
Subjects
Laser beams
Measurement by laser beam
Optical beams
Optical interferometry
Oscillators
Phase measurement
Ultrafast optics
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Summary:A spectrally resolved multiple beam interferometer is capable for measuring the carrier envelope offset phase of ultrashort laser pulses with an accuracy of 70 mrad. The performance has been cross-calibrated with a conventional f-to-2f interferometer.
ISBN:1457712237
9781457712234
ISSN:2160-8989
2160-9004
DOI:10.1364/CLEO_SI.2011.CWI6