Fast computation of substrate resistances in large circuits

In this paper, we describe a method to quickly and accurately estimate substrate coupling effects in analog and mixed digital/analog integrated circuits. Unlike numerical methods, that can be used for circuits containing only a few hundreds of substrate terminals, the new method can quickly extract...

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Bibliographic Details
Published inProceedings ED&TC European Design and Test Conference pp. 560 - 565
Main Authors van Genderen, A.J., van der Meijs, N.P., Smedes, T.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1996
Subjects
Analog integrated circuits
Circuit noise
Circuit simulation
Coupling circuits
Integrated circuit interconnections
Integrated circuit noise
Semiconductor device noise
Substrates
Voltage
Wire
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Summary:In this paper, we describe a method to quickly and accurately estimate substrate coupling effects in analog and mixed digital/analog integrated circuits. Unlike numerical methods, that can be used for circuits containing only a few hundreds of substrate terminals, the new method can quickly extract circuits containing many thousands of substrate terminals. Examples are given that show that the method is sufficiently accurate for practical circuit verification. The method has been implemented in the layout-to-circuit extractor Space.
ISBN:9780818674242
0818674245
ISSN:1066-1409
2377-6323
DOI:10.1109/EDTC.1996.494356