Dramatic reduction in dark current of β-Ga2O3 ultraviolet photodectors via β-(Al0.25Ga0.75)2O3 surface passivation
Solar-blind ultraviolet photodetectors with metal-semiconductor-metal structure were fabricated based on β-(Al0.25Ga0.75)2O3/β-Ga2O3 film grown by metal-organic chemical vapor deposition. It was known that various surface states increase dark current and a large number of defects can hinder the tran...
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Summary: | Solar-blind ultraviolet photodetectors with metal-semiconductor-metal structure were fabricated based on β-(Al0.25Ga0.75)2O3/β-Ga2O3 film grown by metal-organic chemical vapor deposition. It was known that various surface states increase dark current and a large number of defects can hinder the transport of carriers, resulting in low switching ratio and low responsivity of the device. In this work,β-(Al0.25Ga0.75)2O3 films are used as surface passivation materials. Owning to its wide band gap, we obtain excellent light transmission and high lattice matching withβ-Ga2O3. We ex-plore the change and mechanism of the detection performance of theβ-Ga2O3 detector afterβ-(Al0.25Ga0.75)2O3 surfacepassivation. It is found that under the illumination with 254 nm light at bias 5 V, theβ-(Al0.25Ga0.75)2O3/β-Ga2O3 pho-todetectors show dark current of just 18 pA and high current on/off ratio of 2.16 × 105. The dark current is sharply reduced about 50 times after passivation of theβ-Ga2O3 surface, and current on/off ratio increases by approximately 2 times. It isobvious thatβ-Ga2O3 detectors withβ-(Al0.25Ga0.75)2O3 surface passivation can offer superior detector performance. |
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ISSN: | 1674-1056 |
DOI: | 10.1088/1674-1056/ac8a8e |