De-embedding techniques for transmission lines: An application to measurements of on-chip coplanar traces

In this paper, the de-embedding study presented in the work of Erickson et al. (2013) is extended from the simulation environment to the measurement environment; the three presented de-embedding methods are applied to measurements of on-chip coplanar traces for two different test ICs. Additionally,...

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Bibliographic Details
Published in2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) pp. 660 - 666
Main Authors Erickson, Nicholas, Jun Fan, Xu Gao, Achkir, Brice, Siming Pan
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2014
Subjects
Calibration
Power transmission lines
Probes
Semiconductor device measurement
System-on-chip
Transmission line measurements
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Summary:In this paper, the de-embedding study presented in the work of Erickson et al. (2013) is extended from the simulation environment to the measurement environment; the three presented de-embedding methods are applied to measurements of on-chip coplanar traces for two different test ICs. Additionally, the Hybrid technique presented in work of Erickson et al. is reformulated so that only two measurement standards are required, as opposed to three. The results of de-embedding the measurement data are discussed, as well as challenges with making the measurements.
ISBN:9781479955442
1479955442
ISSN:2158-110X
2158-1118
DOI:10.1109/ISEMC.2014.6899052